IEEE TTTC Test Technology Educational Program (TTEP) 2002

Two TTEP 2002 tutorials are offered on Sunday May, 26th on emerging test technology topics.

Tutorial 1
Embedded Test for Low-Cost Manufacturing, Janusz Rajski - Mentor Graphics

This tutorial presents state-of-the-art embedded test technology, practices and automation tools. It covers guidelines for design of BIST-able cores, techniques for random pattern testability, as well as BIST architectures for random logic and memory arrays. It also presents new embedded test methodologies based on deterministic patterns, such as LFSR reseeding, OPMISR, Smart BIST, and Embedded Deterministic Test, developed specifically to reduce the volume of test data and test time without modification of system logic. Special emphasis is placed on issues related to at-speed testing. The material is illustrated with many applications and case studies. Attendees receive hard copies and a CD-ROM of the presented material.

Tutorial 2
Scan-Based Logic Test: Fundamentals and Recent Developments, Bernd Koenemann - IBM

Beginning with a keynote speech at the 1999 International Test Conference and the 1999 International Technology Roadmap for Semiconductors, the concepts of structural testing, DFT-testers, and Test Resource Partitioning have experienced a large increase in publicity. Advanced scan-based logic test techniques are now emerging in practice to address the issues of testing complex system-level products using very deep sub-micron technologies.
The tutorial combines the discussion of practical scan-based logic design and test architectures originally introduced as system-level concepts with practical examples from more recent experience with leading-edge microprocessors, ASICs, SoCs, standard products, packages, and systems. In addition to an overview of basic scan-based logic design, test, and diagnostic approaches, we will introduce some modern proposals for solving emerging problems like I/O bandwidth constraints, and power/noise management.

For further information about TTTC TTEP 2002 check: http://tab.computer.org/tttc/teg/ttep.