General Co-Chairs
D. Gizopoulos - U. Piraeus (GR)
A. Paschalis - U. Athens (GR)
General Vice Chair
E.J.Marinissen - Philips Research (NL)

Program Chair / Vice Chair
S. Hellebrand - U. Innsbruck (A)
H. Manhaeve - Q-Star Test (B)
Local Chair
C. Halatsis - U. Athens (GR)
Publicity Chair
C. Douligeris - U. Piraeus (GR)
Panel Chair
C. Landrault - LIRMM (F)
Tutorials Chair
G. Carlsson - Ericsson (S)
Industrial Relations Chair
H. Vranken - Philips Research (NL)
Finance Chair
M. Psarakis - U. Athens (GR)
Publications Chair
H.-J. Wunderlich - U. Stuttgart (D)
Asia-Pacific Liaison
H. Fujiwara - NAIST (Japan)
Latin America Liaison
F. Vargas - PUCR (Brazil)
North America Liaison
V. D. Agrawal - Agere (USA)
Steering Committee
B. Bennetts - Bennetts Assoc. (UK)
G. Carlsson - Ericsson (S)
J. Figueras - U. Polit. de Catalunya (E)
D. Gizopoulos - U. Piraeus (GR)
C. Landrault - LIRMM (F)
E.J.Marinissen - Philips Research (NL)
P. Muhmenthaler - Infineon (D)
A. Paschalis - U. Athens (GR)
Z. Peng - U. Linkoping (S)
P. Prinetto - Polit. di Torino (I)
J.P. Teixeira - IST/INESC-id (P)
H.-J. Wunderlich - U. Stuttgart (D)
Y. Zorian - LogicVision (USA)
Program Committee
Topic Chairs:
B. Becker - U. Freiburg (D)
M. Lobetti Bodoni - Siemens ICN (I)
A. Osseiran - Fluence (CH)
P. Prinetto - Polit. di Torino (I)
Members:
E.J. Aas - Norw. U. of Science (N)
B. Al-Hashimi - U. Southampton (UK)
J. Alt - Infineon (D)
B. Bennetts - Bennetts Assoc. (UK)
A. Benso - Polit. di Torino (I)
G. Carlsson - Ericsson (S)
W. Daehn - FEIH Wismar (D)
P. Dahlgren - Chalmers U. Tech. (S)
J. Figueras - U. Polit.de Catalunya (E)
H. Fujiwara - NAIST (J)
F. Fummi - U. di Verona (I)
R. Galivance - Intel (USA)
P. Girard - LIRMM (F)
D. Gizopoulos - U. Piraeus (GR)
M. Hirech - Synopsys (USA)
J. Hlavicka - Czech Technical U. (CZ)
A. Hlawiczka - U. Gliwice (PL)
J.L. Huertas - U. de Sevilla (E)
H. Kerkhoff - U. Twente (NL)
M. Kessler - IBM (D)
C. Landrault - LIRMM (F)
M. Lubaszewski - UFRGS (BR)
Y. Makris - Yale U. (USA)
E.J.Marinissen - Philips Research (NL)
P. Maxwell - Agilent Tech. (USA)
L. Miclea - U. Cluj-Napoca (RO)
S. Mir - TIMA CMP (F)
P. Muhmenthaler - Infineon (D)
M. Ohletz - Alcatel Microelec. (B)
A. Orailoglu - UC San Diego (USA)
A. Paschalis - U. Athens (GR)
Z. Peng - U. Linkoping (S)
M. Renovell - LIRMM (F)
A. Richardson - U. Lancaster (UK)
C. Robach - ESISAR (F)
P. Sanchez - U. Cantabria (E)
R. Segers - Philips Semicond. (NL)
M. Sonza Reorda - Polit. di Torino (I)
M. Spadari - LSI Logic (I)
B. Straube - EAS/IIS FhG (D)
J.P. Teixeira - IST/INESC-id (P)
J. Tyszer - Poznan Tech. U. (PL)
R. Ubar - U. Tallinn (EE)
H.-J. Wunderlich - U. Stuttgart (D)

The IEEE European Test Workshop is a well-recognized forum for presenting and discussing trends, emerging results, practical applications, and hot topics in the area of electronic-based circuit and system testing. The seventh workshop will take place in 2002 at Corfu Island, the "Emerald Island" of Greece, known for its elegant architecture and its mountainous skyline plunging into the bluest of blue waters. ETW'02 is sponsored by the IEEE Computer Society - Test Technology Technical Council (TTTC) and co-organized by the University of Athens and the University of Piraeus. We cordially invite you to participate and submit your contribution to ETW'02, which includes (but is not limited to) the following topics:

Analog, Mixed-Signal and RF Test
ATE Hardware and Software
ATPG and High Level TPG
Debug and Diagnosis
Defect/Fault Tolerance and Reliability
Design Verification/Validation
Emerging Testability Standards
Failure Analysis, Defect and Fault Modelling
Fault Simulation
FPGA and Embedded PGA Test
High Level DfT § IDDX Test
Low Cost Testers

Submissions: For the Research Track, the Program Committee invites original submissions of at least 1,000 and at most 5,000 words focusing on new concepts and methodologies; full paper submissions are preferred. For the Application Track, extended abstract or full paper submissions are invited focusing on case studies and reports on industrial and/or academic experiences, practices and developments. Electronic submission in Postscript or PDF via the workshop web page, which also informs about the review criteria for both Tracks, is strongly encouraged. Please identify a contact author with complete information (mailing address, phone number, fax number and e-mail address).

Proceedings: On site, ETW'02 will deliver handouts of the accepted contributions whose authors wish to provide the corresponding materials. After the workshop, formal proceedings of selected papers will be published by the IEEE Computer Society. The Program Committee will select the contributions to be included in the formal proceedings based on the review results and the quality of the papers included in the handouts. The best contributions will appear in a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA), published by Kluwer.

• Submission of full papers or extended abstracts: February 1, 2002
• Notification of acceptance: March 25, 2002

IEEE TTTC Test Technology Educational Program (TTEP) 2002

TTEP 2002 tutorials will be offered during May, 26th on emerging test technology topics. Tutorial proposals should be submitted according to the guidelines given at http://computer.org/tab/tttc/teg/ttep.

Further Information:

General Co-Chair:
Dimitris Gizopoulos
University of Piraeus
Department of Informatics
80 Karaoli & Dimitriou Str.
GR-18534 Piraeus, Greece
Tel.: +30 10 414 2372
Fax: +30 10 414 2264
E-mail: dgizop@unipi.gr